Kelvin Probe Head
To meet the increasing requirement of accurate & stable voltage measurement, LEENO has been supplying Full Kelvin or Mixed Kelvin Probe Head to many global customers.
Specifications
- Contact Object
- Bump, Pad, Cu-pillar, etc.
- Pitch
- ≥250um(Bump) / ≥150um(Pad)
PRODUCT SERIES
Contact Object
Bump
Pitch(um)
500
No. of Site
16
Contact Object
Pad
Pitch(um)
150
No. of Site
8
Contact Object
Bump
Pitch(um)
350
No. of Site
16