LEENO

Fine Pitch Spring Contact Probe and Micro Drilling

LEENO manufactures fine pitch probes to 75 micron using high precision CNC machines. Fine pitch solutions are provided with housing (Socket) developed through advanced machining

110GHz Vector Network Analyzer (PNA-X)

Providing 2Port, 110GHz measurement data through N5244B/N5292A PNA-X Network Analyzer. RF specifications of Test Probe based Sockets from 2Port (110GHz) through 4Port (43GHz). RF specification

Fine Pitch Coaxial Probe

With unparalleled technology of coaxial structure, high precision machining and assembly, LEENO provides Fine Pitch (down to 0.25mm) Coaxial Probes to customers with; High Bandwidth

Coaxial Interface Probe Head

Application: Front End Module(Filters, Amplifiers, Switches, etc.) Features: Coaxial System Configuration through SMA → Coaxial Cable → Coaxial Socket(Spring Contact Probe) → Wafer Die (No

One Touch Socket

Boltless Socket which can be mounted onto the PCB by one touch. Dramatic Decrease of Down Time through One Step Mounting or Demounting of Socket

Module Connector Test Socket & Probe

2 Different Types, Arrow or Fork, of Probe Applicable depending on Connector Clip Shape (Male or Female Type) Higher Yield through Optimized 2-point Contact with

RF Fine Pitch Probe

LEENO can provide the solution for RF fine pitch spring contact probe such as 130 um device pitch with 2mm overall length. Fine Pitch Spring

Fine Pitch Non Magnetic Probe

LEENO has succeeded in developing Fine Pitch Non-magnetic Spring Probes in order to meet test requirements for fast growing use of Hall ICs/Sensors that are

Logic Test Socket

Offers test sockets for use on a wide range of packages (i.e., BGA, LGA, QFN, QFP, CSP, TSOP, SOP) and PoP; can be used for

Probe Head

Kelvin probe head is designed using LEENO’s best processing technology. The Probe Head can have a long life span using optimized Kelvin spring probe contacts which also can

RF Socket

With unparalleled technology, coaxial structure, and high-precision machining equipment, LEENO can provide RF test socket with high bandwidth, impedance matching and high frequency up to...

Memory Test Socket

Using advanced precision injection equipment and patented technology, LEENO can provide Total Solution for various packaged-to-fit memory sockets and their test environment.

Elastomer Socket

As a structure made of silicon and conductive powder, elastomer is a good solution for high speed, no ball damage, stable CRES, low force and

Camera Module Socket

Designed for module testing, the socket includes the connector, camera and a Flexible PCB. Each component can be easily maintained and can be applied to

SLT Socket

Mobile Phone, Tablet, TV Board, Set-top box etc. LEENO can provide a System Level Test solution on various types of packages.

Spring Contact Probe (ICT)

LEENO provides a variety of choices, offering over 1,000 standard ICT probe types. The ICT probes can be customized to deliver optimum solutions to customers.

Semiconductor Probe

Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO’s Total Interface Solution.

Medical Equipment

The core components that make up the medical ultrasound probe are provided in high-precision processing technology based on the international standards of medical equipment.