Fine Pitch Probe
Thinnest & Shortest Fine Pitch Spring Contact Probes specifically designed for Wafer Level (RF) testing purpose.
Specifications
- Barrel diameter
- ≥75um
- Probe length
- ≥2.00mm
- Spring force
- ≥3.00g (Customized)
- Frequency
- ≥50Ghz
![]( https://leeno.com/wp-content/uploads/2023/12/fine-pitch-사진-최신.png꾸미기수정제품-2.jpg)
![]( https://leeno.com/wp-content/uploads/2023/12/fine-pitch-사진-최신.png꾸미기수정제품-2.jpg)
Thinnest & Shortest Fine Pitch Spring Contact Probes specifically designed for Wafer Level (RF) testing purpose.