Fine Pitch, Large Pin Count Probe Head
LEENO can provide Fine Pitch Large Pin Count Probe Head for wafer level testing with pitch ≥92um or pin count more than 30K.
Specifications
- Contact Object
- Bump, Pad, Cu-pillar, etc.
- Pitch
- ≥92um
PRODUCT SERIES
Contact Object
BUMP
Pitch(um)
180
Pin Count
30,XXX