OUR PRODUCTS

LEENO offers a diverse range of testing options; Spring Contact Probes, IC Test Sockets, WLCSP Probe Heads, Battery Charging & Discharging Probes and Medical Components providing you with a comprehensive range of options.

Our competitive advantage lies in our ability to provide customized solutions. Here, you can gain deeper insights into the extensive spectrum of products and services offered by LEENO.

NEW PRODUCTS LINE

0.80mm Probe

Shortest Spring Contact Probe specifically designed for High Speed testing purpose.

Large Device Test Socket

Offers test sockets for use on a wide range of packages (i.e., BGA, LGA, QFN, QFP, CSP, TSOP, SOP) and PoP; can be used for Multi-Parallelism, a total solution for the logic test socket.

Fine Pitch RF Probe Head

LEENO can provide fine pitch RF Probe Head for wafer level testing with multi-site & large pin count for device pitch ≥130um.

Fine Pitch, Large Pin Count Probe Head

LEENO can provide Fine Pitch Large Pin Count Probe Head for wafer level testing with pitch ≥92um or pin count more than 30K.

Fine Pitch Probe

Thinnest & Shortest Fine Pitch Spring Contact Probes specifically designed for Wafer Level (RF) testing purpose.

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