Kelvin Probe Head
为了满足对准确稳定的电压测量日益增长的需求，LEENO持续提供全球客户全开尔文或混用开尔文探针头。
Specifications
- Contact Object
- Bump, Pad, Cu-pillar, etc.
- Pitch
- ≥250um(Bump) / ≥150um(Pad)
PRODUCT SERIES
Contact Object
BUMPBump
Pitch(um)
0.5
No. of Site
16
Package Type
Pad
Pitch
0.15
Site
8
Package Type
Bump
Pitch
350
Site
16