Fine Pitch, Large Pin Count Probe Head
LEENO可以提供适用于晶圆级测试的小间距巨量针数探针头,适用于间距≥92微米或针数超过30,000个的情况。
Specifications
- Contact Object
- Bump, Pad, Cu-pillar, etc.
- Pitch
- ≥92um
PRODUCT SERIES
Contact Object
BUMP
Pitch(um)
180
Pin Count
30,XXX