Semiconductor Probe
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO’s Total Interface Solution.
Product Series
| From fine pitch probe | |
| Barrel Diameter | 0.08mm ~ |
| Probe Length | A mm ~ 4.5mm ~ Z mm |
From fine pitch probe
Barrel Diameter 0.08mm ~
Probe Length A mm ~ 4.5mm ~ Z mm
| RF probe | |
| Barrel Diameter | 0.25mm ~ |
| Probe Length | 0.85 mm ~ 1.23mm ~ Z mm |
