LEENO can provide the solution for RF fine pitch spring contact probe such as 130 um device pitch with 2mm overall length.
Fine Pitch Spring Contact solution for High Frequency Testing was developed through advanced mechanical /electronic R&D technology, high precision machining capability and accurate assembly capability.
Distinct Features & Advantages
◆ OAL 2.0mm Spring Contact Probe for 130~150um Pitch
High Pin Count RF Probe Card/Head
◆ Signal Length 1.75mm, Excellent Performance for High Bandwidth Testing
From Precision Machining to Injection (Molding), Plating/Coating, and Assembly, our Total Manufacturing Processes provides the highest quality products with the shortest production/delivery time to ensure customer satisfaction.