Probe Head

Kelvin probe head is designed using LEENO’s best processing technology. The Probe Head can have a long life span using optimized Kelvin spring probe contacts which also can be used for high current wafer testing. Fine pitch spring probes or Cobra pins can provide 92um pitch with greater than 30K points on the Probe Card.


Package type
Wafer (WLCSP)
Kelvin, Cobra, RF

Product Series

Customized Solution for your needs

LEENO’s 100% in-house manufacturing process provides our customers with the best quality & fast delivery.

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100% In-house Manufacturing

From Precision Machining to Injection (Molding), Plating/Coating, and Assembly, our Total Manufacturing Processes provides the highest quality products with the shortest production/delivery time to  ensure customer satisfaction.