Fine Pitch Non Magnetic Probe

LEENO has succeeded in developing Fine Pitch Non-magnetic Spring Probes in order to meet test requirements for fast growing use of Hall ICs/Sensors that are used for proximity switching, positioning or current sensing along with speed detection in mobile, automotive, industrial and other fields. This fine pitch non-magnetic spring probe ensures accurate measuring of DUT by minimizing possibility of probe itself disturbing natural magnetic fields of the earth.
Custom-designed non-magnetic spring probes are available
for device pitch of 200㎛ and larger.

Mechanical Spec. : 200㎛ Pitch Probe

Spring Force
5.2g @ 0.30mm
Recommended Travel
0.30mm
Full Travel
0.50mm
Material
Plunger – Pd Alloy / No plated
Plunger – Pd Alloy / No plated
Barrel – Au Alloy / Au plated
Spring – SUS Wire / Au plated

FinePitchNonMagneticProbe_03

Customized Solution for your needs

LEENO’s 100% in-house manufacturing process provides our customers with the best quality & fast delivery.

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100% In-house Manufacturing

From Precision Machining to Injection (Molding), Plating/Coating, and Assembly, our Total Manufacturing Processes provides the highest quality products with the shortest production/delivery time to  ensure customer satisfaction.

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